Committee

Committee

 

 Conference Chair

   Prof. Shiyuan Liu (Huazhong University of Science and Technology, China)

 

 Honorary Chairs

  Prof. Zheng You (Huazhong University of Science and Technology, China)
  Prof. Xiangqian (Jane) Jiang (University of Huddersfield, UK)

 

 

 Steering Committee
Chair   Yongsheng Gao   Hong Kong University of Science and Technology, Hong Kong (China)
Members   Masato Aketagawa   Nagaoka University of Technology, Japan
  Harald Bosse   Physikalisch Technische Bundesanstalt, Germany
  Liang-Chia Chen   National Taiwan University, Taiwan (China)
  Xuedong Chen   Huazhong University of Science and Technology, China
  Han Ding   Huazhong University of Science and Technology, China
  Kuang-Chao Fan   National Taiwan University, Taiwan (China)
  Xiang Fang   National Institute of Metrology, China
  Wei Gao   Tohoku University, Japan
  Zhuangde Jiang   Xi'an Jiaotong University, China
  Seung-Woo Kim   Korea Advanced Institute of Science and Technology, Korea
  Jeong Seok Oh   Korea Institute of Machinery and Materials, Korea
  Kseniia Sapozhnikova   D.I.Mendeleyev Institute for Metrology, Russia
  Kiyoshi Takamasu   University of Tokyo, Japan
  Jiubin Tan   Harbin Institute of Technology, China
  Lijiang Zeng   Tsinghua University, China

 

 

  Program Committee
Chair   Shuming Yang   Xi'an Jiaotong University, China
Members   Ossama Badie Shafik Abouelatta   Mansoura University, Egypt
  Oriol Arteaga   University of Barcelona, Spain
  Bernd Bodermann   Physikalisch Technische Bundesanstalt, Germany
  Ping Cai   Shanghai Jiaotong University, China
  Liangcai Cao   Tsinghua University, China
  Benyong Chen   Zhejiang Sci-Tech University, China
  Xinbin Cheng   Tongji University, China
  Changcai Cui   China Jiliang University, China
  Gaoliang Dai   Physikalisch Technische Bundesanstalt, Germany
  Qibo Feng   Beijing Jiaotong University, China
  Ryoshu Furutani   Tokyo Denki University, Japan
  Han Haitjema     KU Leuven, Belgium
  Hans Nørgaard Hansen   Technical University of Denmark, Denmark
  Pengcheng Hu   Harbin Institute of Technology, China
  Bingfeng Ju   Zhejiang University, China
  Daesuk Kim   Jeonbuk National University, Korea
  Cuifang Kuang   Zhejiang University, China
  Syuhei Kurokawa   Kyusyu University, Japan
  Jian Liu   Harbin Institute of Technology, China
  Jun Liu   North University of China, China
  Wei Liu   Dalian University of Technology, China
  Xiaokang Liu   Chongqing University of Technology, China
  Wenlong Lu   Huazhong University of Science and Technology, China
  Lirong Qiu   Beijing Institute of Technology, China
  Osamu Sato   National Metrology Institute of Japan, Japan
  Zhaoyao Shi   Beijing University of Technology, China
  Yasuhiro Takaya   Osaka University, Japan
  Yidong Tan   Tsinghua University, China
  Roald Taymanov   D.I.Mendeleyev Institute for Metrology, Russia
  Zhenzhong Wei   Beihang University, China
  Liandong Yu   China University of Petroleum, China
  Hongwei Zhao   Jilin University, China
  Weiqian Zhao   Beijing Institute of Technology, China
  Weihu Zhou   Institute of Microelectronics,  Chinese Academy of Sciences, China
  Jigui Zhu   Tianjin University, China

 

 

  Organizing Committee
Chair   Jinlong Zhu   Huazhong University of Science and Technology, China
Members   Xiuguo Chen   Huazhong University of Science and Technology, China
  Yuanliu Chen   Zhejiang University, China
  Hui Deng   South University of Science and Technology, China
  Weijie Deng   Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, China
  Honggang Gu   Huazhong University of Science and Technology, China
  Chunguang Hu   Tianjin University, China
  Shuchun Huo   Institute of Microelectronics,  Chinese Academy of Sciences, China
  Hao Jiang   Huazhong University of Science and Technology, China
  Jiamin Liu   Huazhong University of Science and Technology, China
  Nan Lin   Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
  Xinghui Li   Tsinghua Shenzhen International Graduate School, China
  Yuejing Qi     Institute of Microelectronics,  Chinese Academy of Sciences, China
  Yufu Qu   Beihang University, China
  Hua Shen   Nanjing University of Science and Technology, China
  Junkai Shi   Institute of Microelectronics,  Chinese Academy of Sciences, China
  Rong Su   Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
  Yushu Shi   National Institute of Metrology, China
  Jun Tang   North University of China, China
  Zirong Tang   Huazhong University of Science and Technology, China
  Yibin Tian   Shenzhen University, China
  Weibo Wang   Harbin Institute of Technology, China
  Guanhao Wu   Tsinghua University, China
  Haojie Xia   Hefei University of Technology, China
  Qi Xia   Huazhong University of Science and Technology, China
  Guofeng Zhang   Xi'an Jiaotong University, China
  Xiangchao Zhang   Fudan University, China
  Zonghua Zhang   Hebei University of Technology, China
  Chenyang Zhao   Harbin Institute of Technology (Shenzhen), China
  Renjie Zhou   Chinese University of Hong Kong, Hong Kong (China)